NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

C^-diamond

diamond

7782-40-3

element

Citation:

Author Name(s):

Lau W.M., Huang L.J., Bello I., Yiu Y.M., Lee S.-T.

Journal:

J. Appl. Phys. 75, 3385

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

283.70

0.1

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

IIB p-diamond. Unreconstructed surface. The sample was vacuum annealed to about 623 K.

Specimen:

Method of Determining Specimen Composition:

Auger Electron Spectroscopy, X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300