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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
TlV2Cr3S8
thallium divanadium trichromium octasulfide
chalcogenide, II-VI semiconductor, sulfide

Citation:
Bensch W., Worner E., Muhler M.
Mater. Res. Bull. 29, 155
Pub Year:
1994

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Weighted amounts of the elements were heated to 1273 K for seven days and afterwards were slowly cooled to 300 K. The product consisted of black needles with a metallic lustre. The composition determined by XPS was TlV1.7Cr2.4S8.

Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

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