There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Tl
Formula:
TlVCr4S8
Name:
thallium vanadium tetrachromium octasulfide
CAS Registry No:
Class:
chalcogenide, II-VI semiconductor, sulfide

Citation:
Author Name(s):
Bensch W., Worner E., Muhler M.
Journal:
Mater. Res. Bull. 29, 155
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4f7/2
Binding Energy (eV)
118.60
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.7
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Weighted amounts of the elements were heated to 1273 K for seven days and afterwards were slowly cooled to 300 K. The product consisted of black needles with a metallic lustre. The composition determined by XPS was TlV0.9Cr2.9S8.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
An error has occurred. This application may no longer respond until reloaded. Reload 🗙