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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Al
Formula:
Al
Name:
aluminum
CAS Registry No:
7429-90-5
Class:
element

Citation:
Author Name(s):
Theis W., Horn K.
Journal:
Phys. Rev. B 47, 16060
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Doublet Separation for Photoelectron Lines
Line Designation:
DS-2p
Double Separation (eV)
0.41
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
82 - 110
Overall Energy Resolution (eV):
0.07
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Al(100). Peak locations: Doniach - Sunjic & Gaussian. The crystals were cleaned by cycles of Ne+ ion sputtering at room and elevated temperatures and annealed up to 900 K. Asymmetry parameter = 0.075 - 0.110.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
125
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