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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Ge0.50Se0.50
germanium selenium (Ge0.50Se0.50)
12065-10-0
chalcogenide, glass, IV-VI semiconductor, selenide

Citation:
Theye M.-L., Gheorgiu A., Senemaud C., Kotkata M.F., Kandil K.M.
Phil. Mag. B 69, 209
Pub Year:
1994

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sample was prepared by thermal evaporation.

Specimen:
Method of Determining Specimen Composition:
Electron-Probe Microanalysis
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300

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