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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Sn
Formula:
SnS2
Name:
tin disulfide
CAS Registry No:
1315-01-1
Class:
chalcogenide, II-VI semiconductor, IV-VI semiconductor, sulfide

Citation:
Author Name(s):
Ettema A.R.H.F., Haas C.
Journal:
J. Phys. Cond. Matter 5, 3817
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
4d
Binding Energy (eV)
26.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.9
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was synthesized by heating Sn with the correct molar amount of S for one week. After cooling, small crystals were selected. The sample was cleaned by stripping with Scotch tape

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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