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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
Si/B/K
surface state
titanium dioxide/potassium
element

Citation:
Weitering H.H., Chen J., DiNardo N.J., Plummer E.W.
Phys. Rev. B 48, 8119
Pub Year:
1993

Data Processing:
Interface Core-Level Shift
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
other source
X-ray Energy:
120
Overall Energy Resolution (eV):
0.5
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Saturation coverage of K on Si(111)-(R3xR3)R30-B. The substrate was prepared by exposing he clean lightly-doped n-type surface (7x7) with a resistivity of 1 ohm cm to B10H14 and by subsequent annealing (T = 1173 K). The relative intensity was 0.68. Branching ratio = 0.5.

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300

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