NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

surface component

tungsten

7440-33-7

element

Citation:

Author Name(s):

Kim B., Chen J., Erskine J.L., Mei W.N., Wei C.M.

Journal:

Phys. Rev. B 48, 4735

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

31.15

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.150

Lorentzian Width (eV):

0.084

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.15

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

W(110). The sample was cleaned by annealing in O2 followed by flashing to 2300 K. Singularity index = 0.063.

Specimen:

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300