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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
Na5.2(NH4)46.8Al52Si140O384
Name:
sodium ammonium aluminum silicon oxide
CAS Registry No:
Class:
ammonium, oxide

Citation:
Author Name(s):
Guimon C., Boreave A., Pfister-Guillouzo G.
Journal:
Surf. Interface Anal. 22, 407
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV)
103.20
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag,Cu = 368.27,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
An electron flood gun (Ep = 5 eV) was used for charge compensation. FAT mode. The intensity ratio of the Gaussian/Lorentzian components was 80/20. The total FWHM is 1.8 eV. The sample was heated prior analysis at 673 K for 1 h and also at 973 K.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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