NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

TlCr₅S₈

Name:

thallium pentachromium octasulfide

CAS Registry No:

Class:

chalcogenide, sulfide

Citation:

Author Name(s):

Bensch W., Worner E., Muhler M., Ruschewitz U.

Journal:

J. Solid State Chem. 110, 234

DOI:

Pub Year:

1994

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Data Processing:

Photoelectron Line

4f_7/2

118.75

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.8

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was prepared by reacting the elements at 1273 K for 10 days. After reducing the temperature to 1223 K the sample was fired for 5 days.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

295