NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Rb/Rh

rubidium/rhodium

7440-17-7

element

Citation:

Author Name(s):

Lundgren E., Qvarford M., Nyholm R., Andersen J.N., Heskett D.

Journal:

Phys. Rev. B 50, 4711

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Data Type:

Interface Core-Level Shift

Line Designation:

INT-4p

Interface Core-Level Shift

-0.77

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.1

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Rb/Rh(111). The deposition temperature was 90 K. The substrate was cleaned by cycles of Ar+ ion bombardment and annealing.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):