There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ta
Formula:
Ta
Name:
tantalum
CAS Registry No:
7440-25-7
Class:
element

Citation:
Author Name(s):
Riffe D.M., Wertheim G.K.
Journal:
Phys. Rev. B 47, 6672
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Surface Core-level Shift for the Second Layer of Atoms
Line Designation:
SS1-4f7/2
Surface Core-Level Shift (eV) for the first Layer of Atoms
0.36
Energy Uncertainty:
0.012
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
0.110
Lorentzian Width (eV):
0.052

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
70, 100
Overall Energy Resolution (eV):
0.08
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Ta(110). The FWHM of the bulk component was 0.088+-0.020 eV. Peak locations: Doniach - Sunjic & Gaussian. Singularity index = 0.133+-0.012. The spectra were recorded at normal emission.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
80
An error has occurred. This application may no longer respond until reloaded. Reload 🗙