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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
germanium
element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

Citation:
Durrwachter M., Indlekofer G., Boyen H.-G., Oelhafen P., Quitmann D.
J. Non-cryst. Solids 156, 241
Pub Year:
1993

Data Processing:
Photoelectron Line
mixed Gaussian/Lorentzian

Measurement:
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:

Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):

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