NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

ruthenium

7440-18-8

catalyst, element

Citation:

Author Name(s):

Hrbek J., van Campen D.G., Malik I.J.

Journal:

J. Vac. Sci. Technol. A 13, 1409

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

279.96

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The crystal was cleaned by succesive oxidation cycles at 500 K and flash desorption to 1560 K. Peak locations: Doniach - Sunjic & Gaussian.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300