NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Tb

Tb/W

(sup ₈)S₇/₂ multiplet

terbium/tungsten

CAS Registry No:

7440-27-9

element, lanthanide, rare earth

Citation:

Author Name(s):

Starke K., Baumgarten L., Arenholz E., Navas E., Kaindl G.

Phys. Rev. B 50, 1317

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

Line Designation:

4f_7/2

Binding Energy (eV)

2.40

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

48

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

150 +-10 A Tb(0001) were deposited onto W(110) at ~110 K and annealed (T = 900 K, time = 5 min). The thickness was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

110

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