NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

manganese

7439-96-5

element

Citation:

Author Name(s):

Jenks C.J., Chang S.-L., Anderegg J.W., Thiel P.A., Lynch D.W.

Journal:

Phys. Rev. B 54, 6301

DOI:

Pub Year:

1996

bookAll Records in this Publication

Data Processing:

Photoelectron Line

2p_1/2

649.50

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.65

Lorentzian Width (eV):

1.24

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.65

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was annealed at 870 K. Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.51.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300