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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Al
Formula:
AlOx/Al
XPS Formula:
oxide state
Name:
aluminum oxides/aluminum
CAS Registry No:
7429-90-5
Class:
anhydride, catalyst, element, non-stoichiometric oxide, oxide

Citation:
Author Name(s):
Chang S.-L., Anderegg J.W., Thiel P.A.
Journal:
J. Non-cryst. Solids 195, 95
DOI:
Pub Year:
1996

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV)
75.60
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.31
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
0.65
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The Al sample was exposed to more than 80 L O2 at 870 K. The FWHM was evaluated after a linear background subtraction. FAT mode. Emission angle = 45 degrees.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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