NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

silver

7440-22-4

element

Citation:

Author Name(s):

Seah M.P.

Journal:

J. Electron Spectrosc. Relat. Phenom. 97, 235

DOI:

Pub Year:

1998

book All Records in this Publication

Data Processing:

Auger-Electron Line

M₄N₄₅N₄₅

357.88

0.0

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Calibration value from the U.K. National Physical Laboratory

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):