NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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S

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

thiophene atoms

chromium/poly(3-hexylthiophene)

CAS Registry No:

104934-50-1

other ring, polymer, sulfur

Author Name(s):

Lachkar A., Selmani A., Sacher E.

Synthetic Metals 72, 73

Pub Year:

1995

book All Records in this Publication

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV):

164.07

Energy Uncertainty:

0.1

Background Subtraction Method:

Shirley

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

15 A Cr/(-C4HS((CH2)5CH3)-)n.The substrate was outgassed by a brief heating to 373 K. The fitting was done in accordance with the stoichiometry. FAT mode. The thickness was measured using a quartz-crystal thickness monitor.

cast film, thin film, vapor deposited

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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