NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Element:

Formula:

Zn₀.₅₀Cd₀.₅₀Se

Name:

zinc(II) cadmium(II) selenide (Zn0.50Cd0.50Se)

CAS Registry No:

Class:

chalcogenide, II-VI semiconductor, selenide

Author Name(s):

Islam R., Rao D.R.

Journal:

J. Electron Spectrosc. Relat. Phenom. 81, 69

DOI:

Pub Year:

1996

book All Records in this Publication

Data Type:

Auger Parameter

Line Designation:

AP-3d, L₃M₄₅M₄₅

Auger Parameter (eV):

1361.10

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was Zn27.29Cd25.88Se46.83. FAT mode.

Specimen:

semiconductor, thin film, vapor deposited

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300