NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Si

B₁₉.₇Si₁₅.₂O₅₇.₂N₇.₈

boron silicon oxide nitride (B19.7Si15.2O57.2N7.8)

CAS Registry No:

nitride, oxide

Author Name(s):

Bois L., L'Haridon P., Laurent Y., Gouin X., Grange P., Letard J.-F., et al.

J. Alloys and Compounds 232, 244

Pub Year:

1996

book All Records in this Publication

Photoelectron Line

Line Designation:

2p

Binding Energy (eV):

103.30

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was prepared by the reaction of gaseous ammonia with B19.2Si15.3O65.4 at 1073 K. An electron flood gun (Ep = 6eV) and a nickel grid placed 3mm above the sample surface were used for charge compensation. FAT mode.

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