NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Sn

SnO₂

tin(IV) dioxide

CAS Registry No:

18282-10-5

anhydride, oxide

Auger-Electron Line

Line Designation:

M₄N₄₅N₄₅

Kinetic Energy (eV):

432.80

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu 3p3, Ag, Cu = 75.13, 368.27, 932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The composition determined by XPS was Sn0.3373O0.6627. FAT mode. Emission angle An electron flood gun (Ep = 5 eV, Ip = 20 mA) was used for charge compensation.

An error has occurred. This application may no longer respond until reloaded. Reload 🗙