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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ge
Formula:
Zn
0
.
203
Ge
0
.
401
P
0
.
328
Name:
zinc germanium phosphide
CAS Registry No:
12025-31-9
Class:
II-VI semiconductor, phosphide
Author Name(s):
Kuhn W.K.
Journal:
Surf. Sci. Spectra 3, 93
DOI:
10.1116/1.1247781
Pub Year:
1994
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3p
3/2
Binding Energy (eV):
121.60
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
2.9
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
FAT mode. Emission angle = 45 degrees. The sample was cleaned by Ar+ ion bombardment (Ep = 3.5 keV, Ip = 0.0025 mA, angle of incidence = 40 degrees).
Specimen:
crystal, sputtered
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
298
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