NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

W

H₂/W

atoms of pinched surface molecules W₂H

hydrogen/tungsten

CAS Registry No:

7440-33-7

element, hydride

Author Name(s):

Jupille J., Purcell K.G., King D.A.

Surf. Sci. 367, 149

Pub Year:

1996

book All Records in this Publication

Surface Core-level Shift for the Third Layer of Atoms

Line Designation:

SS3-4f_7/2

Surface Core-Level Shift (eV) for the third Layer of Atoms:

0.09

Energy Uncertainty:

0.03

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.220

Lorentzian Width (eV):

0.55

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

75

Overall Energy Resolution (eV):

0.22

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

H2/W(100)c(2x2). The coverages were 0.33, 0.44 and 0.55. The substrate was leaned by repeated heating to 1800 K in 1E-6 Torr O2 and flashing in vacuum to 2400 K. Peak locations: Doniach - Sunjic & Gaussian.

annealed, crystal, reduced

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙