NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Al

AlSb

Al*Sb

aluminum stibnide

CAS Registry No:

25152-52-7

III-V semiconductor, stibnide

Author Name(s):

Gualtieri G.J., Schwartz G.P., Nuzzo R.G., Sunder W.A.

Appl. Phys. Lett. 49, 1037

Pub Year:

1986

keyboard_arrow_downbookAll Records in this Publication

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 4

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV):

72.96

Energy Uncertainty:

0.025

Background Subtraction Method:

Linear

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was grown at a substrate temperature of 763 K

An error has occurred. This application may no longer respond until reloaded. Reload 🗙