NIST X-ray Photoelectron Spectroscopy Database

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SiO₂,quartz

silicon(IV) dioxide (Quartz)

60676-86-0

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Shalvoy R.B., Reucroft P.J., Davis B.H.

J. Catal. 56, 336

Pub Year:

1979

Photoelectron Line

2p_3/2

103.20

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment: