NIST X-ray Photoelectron Spectroscopy Database

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SiO₁.₈

Si*O₁.₈

silicon oxide (SiO1.8)

IV semiconductor, IV-VI semiconductor, non-stoichiometric oxide, oxide

Pitts J.R., Thomas T.M., Czanderna A.W., Passler M.

Appl. Surf. Sci. 26, 107

Pub Year:

1986

Photoelectron Line

2p_3/2

103.20

0.05

data

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Fused SiO2 was pumice scrubbed.