NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ca

CaF₂/Si

Ca*F₂/Si

calcium(II) difluoride/silicon

CAS Registry No:

7789-75-5

alkaline earth, fluoride

Interface Core-Level Shift

Line Designation:

INT-3s

Interface Core-Level Shift:

1.80

Energy Uncertainty:

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1.4 ML and 2.5 ML CaF2/Si(111)-(7x7), n-type P-doped with 5 Ohm cm resistivity. CaF2 was deposited at 923-973 K. The thickness was determined by XPS

molecular beam epitaxy, surface coverage from 1ML to 2ML (1ML <= coverage < 2ML), surface coverage from 2ML to 3ML (2ML <= coverage < 3ML), thin layer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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