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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ce
Formula:
CeCu
2
Si
2
Name:
cerium copper silicon imc
CAS Registry No:
Class:
intermetallic, lanthanide, rare earth, silicide
Author Name(s):
Lasser R., Fuggle J.C., Beyss M., Campagna M., Steglich F., Hulliger F.
Journal:
Physica B 102, 360
DOI:
10.1016/0378-4363(80)90192-8
Pub Year:
1980
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4d
Binding Energy (eV):
109.30
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:
Specimen:
scraped
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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