NIST X-ray Photoelectron Spectroscopy Database

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GaP

gallium phosphide

12063-98-8

chalcogenide, II-VI semiconductor, III-V semiconductor, phosphide

Nishitani R., Iwasaki H., Mizokawa Y., Nakamura S.

Jpn. J. Appl. Phys. 17, 321

Pub Year:

1978

Auger Parameter

AP-3d, L₃M₄₅M₄₅(¹G)

1084.90

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Reliable

Comment: