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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
N
Formula:
[(C
2
H
5
)
2
AlNH
2
]
3
XPS Formula:
[(C
2
H
5
)
2
AlN*H
2
]
3
Name:
tris(mu-amido)hexaethyltrialuminum
CAS Registry No:
Class:
organometallic
Author Name(s):
Boyd D.C., Haasch R.T., Mantell D.R., Schulze R.K., Evans J.F., and Gladfelter W.L.
Journal:
Chem. Mater. 1, 119
DOI:
10.1021/cm00001a023
Pub Year:
1989
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
398.80
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Spectra of the materials were obtained by dosing these materials onto a sample of sputter cleaned gold foil at 773 K in the spectrometer.
Specimen:
adsorbed, heated
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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