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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
MoSi
2
Name:
molybdenum disilicide
CAS Registry No:
12136-78-6
Class:
IV-VI semiconductor, silicide
Author Name(s):
Sullivan J.P., Hirano T., Komeda T., Meyer III H.M., Trafas B.M., Waddill G.D et al.
Journal:
Appl. Phys. Lett. 56, 671
DOI:
10.1063/1.103308
Pub Year:
1990
book
All Records in this Publication
Data Type:
Surface Core-level Shift
Line Designation:
SS-2p
Surface Core-Level Shift (eV):
-0.39
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
other type of curve fit
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
35-135
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
MoSi2(001)-(1x1). Excitation energy was 35 - 135 eV. The energy is referenced to the bulk state of the Si2p line.
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
293
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