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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Hf
Formula:
Hf
XPS Formula:
Hf*
Name:
hafnium
CAS Registry No:
7440-58-6
Class:
element
Author Name(s):
Baba Y., Sasaki T.A., Takano I.
Journal:
J. Vac. Sci. Technol. A 6, 2945
DOI:
10.1116/1.575331
Pub Year:
1988
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
7/2
Binding Energy (eV):
14.30
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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