NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Cs

C₂₃Cs

cesium carbon(C23Cs)

CAS Registry No:

Author Name(s):

Estrade-Szwarckopf H., Rousseau B.

J. Phys. Chem. Solids 53, 419

Pub Year:

1992

book All Records in this Publication

Surface Core-level Shift

Line Designation:

SS-3d_5/2

Surface Core-Level Shift (eV):

1.30

Energy Uncertainty:

0.2

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

1.4

Lorentzian Width (eV):

0.39

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Cs-intercallated compound. Asymmetry parameter = 0.12. The relative intensities of the surface component were 0.18 and 0.70 at emission angles 0 and 70 degrees, respectively. Peak locations: Doniach - Sunjic & Gaussian.

cleaved crystal, crystal

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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