NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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V

V₂O₅(SiO₂)₁₁₇

divanadium pentoxide silicon dioxide(V2O5(SiO2)117)

CAS Registry No:

catalyst, double oxide

Author Name(s):

Centi G., Perathoner S., Trifiro F., Aboukais A., Aissi C.F., and Guelton M.

J. Phys. Chem. 96, 2617

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV):

516.90

Energy Uncertainty:

Background Subtraction Method:

Linear

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The V-silicalite was prepared hydrothermally. The composition determined by XPS was V2O5(SiO2)78. After recovery and drying the solid was calcined in air by slowly increasing the temperature to 823 K.

annealed, crystal

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300

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