NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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O

CH₃CH₂OC(O)NHC₆H₄CH₂C₆H₄NHC(O)OCH₂CH₃

CH₃CH₂O*C(O)NHC₆H₄CH₂C₆H₄NHC(O)O*CH₂CH₃

ethyl-4-(4-((ethoxycarbonyl)amino)benzyl)phenylcarbamate

CAS Registry No:

amide, ester, ether, nitrogen, oxygen, phenyl benzene

Author Name(s):

Pertsin A.J., Gorelova M.M., Levin V.Y., Makarova L.I.

J. Appl. Polymer Sci. 45, 1195

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

533.80

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Adduct of diphenyl methane diisocyanate with ethanol. The composition determined by XPS was C0.72O0.17N0.08. FRR mode. The fitting was done in accordance with the stoichiometry. The relative intensity was 0.47. No x-ray induced damage to the sample was de

insulator, thick film

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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