NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

(^-CH₂C(CH₃)(C(O)OCH₂CH₃)^-)n

(^-C*H₂C(C*H₃)(C(O)OCH₂C*H₃)^-)n

poly(ethyl methacrylate)

CAS Registry No:

9003-42-3

ester, oxygen, polymer

Author Name(s):

Lopez G.P., Castner D.G., Ratner B.D.

Surf. Interface Anal. 17, 267

Pub Year:

1991

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

284.80

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Calibration: the difference between the Cu2p3/2 and the Cu3s peaks was 810.1 eV. An electron flood gun was used for charge compensation. The curve-fitting procedure was made in accordance with the stoichiometry. The composition determined by XPS was C3.2O

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