NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Formula:

Pd(S₂CNHCH(CH₂CH(CH₃)₂)COOH)₂

XPS Formula:

Pd(S₂CNHCH(CH₂CH(CH₃)₂)C*OOH)₂

Name:

bis(2-dithiocarboxyamino-4-methyl-pentanoic acid) palladium

CAS Registry No:

Class:

organic acid, organometallic, oxygen

Author Name(s):

Criado J.J., Fernandez I., Macias B., Salas J.M., Medarde M.

Journal:

Inorg. Chim. Acta 174, 67

DOI:

Pub Year:

1990

book All Records in this Publication

Photoelectron Line

289.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

palladium(DL-leucine dithiocarbamate)

Specimen:

solid sample mounted on tape

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300