NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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N

NbN

Niobium nitride

CAS Registry No:

24621-21-4

nitride

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

396.50

Energy Uncertainty:

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

FAT mode. The sample was cleaned by cycles of Ar+ ion bombardment and annealing (T = 823 K). The N2+ ions were implanted at 8 keV ( j = 20 microamperes/cm2 , time = 20 min). The number of implanted atoms was ~2.4E17 ions/cm2.

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