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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ti
Formula:
TiO
2
Name:
titanium(IV) dioxide
CAS Registry No:
13463-67-7
Class:
catalyst, IV-VI semiconductor, mineral, oxide
Author Name(s):
Ingo G.M., Dire S., Babonneau F.
Journal:
Appl. Surf. Sci. 70, 230
DOI:
10.1016/0169-4332(93)90433-C
Pub Year:
1993
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-2p
3/2
, L
3
M
23
M
23
Auger Parameter (eV):
872.90
Energy Uncertainty:
0.15
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,CuLMM,Cu2p3= 84.00,334.95,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
The powder was prepared via a sol-gel process and air thermal heating at 1273 K. FAT mode.
Specimen:
annealed, solid sample mounted on tape
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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