NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

Formula:

C₆₀/Cu

XPS Formula:

carbon atoms in the second, third and fourth layers of C₆₀

carbon/copper

99685-96-8

element

Photoelectron Line

284.54

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.43

Lorentzian Width (eV):

0.184

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.15

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

4 ML of pure C60 in powder form was evaporated from a pyrex ampule heated to 623 +- 50 K onto a clean Cu(100). Asymmetry parameter < 0.004.

Specimen:

Four monolayers (note space between 4 and ML), fullerene, thin layer, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300