NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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W

O₂/WC

oxygen/tungsten carbide

CAS Registry No:

12070-12-1

carbide, non-stoichiometric oxide

Author Name(s):

Hakansson K.L., Johansson H.I.P., Johansson L.I.

Phys. Rev. B 49, 2035

Pub Year:

1994

book All Records in this Publication

Chemical Shift

Line Designation:

CS-4f_7/2

Chemical Shift (eV):

0.29

Energy Uncertainty:

0.01

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.23

Lorentzian Width (eV):

0.13

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

100, 150

Overall Energy Resolution (eV):

0.1

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

30, 100 and 300 L O2/WC(0001)-(1x1).The substrate was gently annealed in O2 to remove possible carbon form of graphite and subsequently flashed to remove the oxygen. The spectra were recorded at normal emission and 40 degrees.

oxidizing atmosphere, oxygen pressure, thin layer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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