NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Si

Na₀.₆H₂₇.₄Al₂₈Si₁₆₄O₃₈₄

sodium hydrogen aluminum silicon oxide (Na0.6H27.4Al28Si164O384)

CAS Registry No:

alkali, oxide

Author Name(s):

Guimon C., Boreave A., Pfister-Guillouzo G.

Surf. Interface Anal. 22, 407

Pub Year:

1994

book All Records in this Publication

Photoelectron Line

Line Designation:

2p

Binding Energy (eV):

103.30

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag,Cu = 368.27,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

An electron flood gun (Ep = 5 eV) was used for charge compensation. FAT mode. The intensity ratio of the Gaussian/Lorentzian components was 80/20. The total FWHM is 1.8 eV. The sample was heated prior analysis at 673 K for 1 h.

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