NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

(C₁₁₂H₁₆₆N₂O₄)n/Cu

aromatic carbons bound to nitrogens and carbons in the benzene fragment of the pyromellitimide unit

poly(2,5,2',5',2",5"-hexadodecyl-p-terphenyl-4,4"-ylen-alt-3,6-diphenyl-1,2,4,5-benzenetetracarboxylic acid diimide)/copper

CAS Registry No:

imide, multiple rings, nitrogen, other ring, phenyl benzene, polymer

Author Name(s):

Steiner U.B., Caseri W.R., Suter U.W., Rehahn M., Schmitz L.

Langmuir 9, 3245

Pub Year:

1993

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

286.30

Energy Uncertainty:

0.2

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The slide of copper was instantly immersed into the adsorption solution that was kept under argon. The film thickness measured by ellipsometry was 20.9 A. The relative intensity was 0.077. The spectra were recorded at normal emission.

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