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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Zn
Formula:
Cd
0
.
88
Zn
0
.
12
Te
Name:
cadmium zinc telluride
CAS Registry No:
Class:
chalcogenide, II-VI semiconductor, telluride
Author Name(s):
Wang M.W., Swenberg J.F., Phillips M.C., Yu E.T., McCaldin J.O., Grant R.W., et al.
Journal:
Appl. Phys. Lett. 64, 3455
DOI:
10.1063/1.111239
Pub Year:
1994
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3p
3/2
Binding Energy (eV):
87.80
Energy Uncertainty:
0.04
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The relaxed layers of CdZnTe were grown at a substrate temperature of 573 K. Peak locations: Voigt function.
Specimen:
crystal, molecular beam epitaxy, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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