NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

O

(P₂O₅)₅₀(ZnO)₅₀

non^-bridging oxygen

diphosphorus pentoxide zinc oxide ((P2O5)50(ZnO)50)

CAS Registry No:

glass, oxide, phosphate

Author Name(s):

Brow R.K.

J. Non-cryst. Solids 194, 267

Pub Year:

1996

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

532.40

Energy Uncertainty:

0.2

Background Subtraction Method:

Linear

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

2.05

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The glass was prepared from mixture of reagent grade ZnO and NH4H2PO4 melted in air (T = 1273 K, time = 1 h). The glass was quenched on stell plate and annealed for 30 min near the glass transition temperature. The P2O5 content was determined by inductively coupled coupled plasma atomic emission spectroscopy.

An error has occurred. This application may no longer respond until reloaded. Reload 🗙