The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.
The following Journal of Physical and Chemical Reference Data articles may also be of interest: Adobe Acrobat Reader is required to view these articles. (1 articles(s) found)
Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces C. J. Powell, A. Jablonski JPCRD28(1) pp. 19-62 (1999) Abstract
November 6, 2008
November 9, 2001)