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Results of Keyword Search:
7 databases found for Auger electron spectroscopy.
glass ball SRD 100 Database for Simulation of Electron Spectra for Surface Analysis (SESSA)Database for Simulation of Electron Spectra for Surface Analysis (SESSA) (PC database for purchase)  Keywords for Database
This database has been designed to facilitate quantitative interpretation of Auger-electron and X-ray photoelectron spectra and to improve the accuracy of quantitation in routine analysis. The database contains all physical data needed to perform quantitative interpretation of an electron spectrum for a thin-film specimen of given composition. A simulation module provides an estimate of peak intensities as well as the energy and angular distributions of the emitted electron flux.
glass ball SRD 82 NIST Electron Effective-Attenuation-Length Database (PC database, no charge)  Keywords for Database
This database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide EALs (to account for effects of elastic-eletron scattering) for applications in surface analysis by Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS).
glass ball SRD 64 NIST Electron Elastic-Scattering Cross-Section Database (PC database, no charge)  Keywords for Database
This database provides values of differential elastic-scattering cross sections, corresponding total elastic-scattering cross sections, phase shifts, and transport cross sections for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 20,000 eV (in steps of 1 eV).
glass ball SRD 71 NIST Electron Inelastic-Mean-Free-Path Database (PC database, no charge)  Keywords for Database
This database provides values of electron inelastic mean free paths (IMFPs) for use in quantitative surface analyses by AES and XPS.
glass ball SRD 154 NIST Auger Electron Spectroscopy Backscattering Factor Database (PC database, no charge)  Keywords for Database
This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy.
glass ball SRD 154 NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy (PC database, no charge)  Keywords for Database
This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs are obtained from Monte Carlo simulations based on two models of electron transport in the material, a simplified model and an advanced model. One assumption for the former model is that the primary-electron beam is unchanged, in intensity, energy or direction, within the information depth for Auger-electron emission. This assumption becomes progressively less useful as the primary energy becomes closer to the core-level ionization energy for the relevant Auger transition or for increasing angles of incidence of the primary electrons.
glass ball SRD 20 X-ray Photoelectron Spectroscopy Database (Version 4.1) (Web, free access)  Keywords for Database
The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.

The following Journal of Physical and Chemical Reference Data articles may also be of interest:
Adobe Acrobat Reader is required to view these articles. (2 articles(s) found)
glass ball Comparison of Electron Elastic-Scattering Cross Sections Calculated from Two Commonly Used Atomic Potentials
A. Jablonski, F. Salvat, C. J. Powell
JPCRD 33(2) pp. 409-451 (2004)
Abstract
glass ball Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces
C. J. Powell, A. Jablonski
JPCRD 28(1) pp. 19-62 (1999)
Abstract


Last modified: November 6, 2008 (Created: November 9, 2001)
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