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Results of Keyword Search:
5 databases found for XPS.
glass ball SRD 100 Database for Simulation of Electron Spectra for Surface Analysis (SESSA)Database for Simulation of Electron Spectra for Surface Analysis (SESSA) (PC database for purchase)  Keywords for Database
This database has been designed to facilitate quantitative interpretation of Auger-electron and X-ray photoelectron spectra and to improve the accuracy of quantitation in routine analysis. The database contains all physical data needed to perform quantitative interpretation of an electron spectrum for a thin-film specimen of given composition. A simulation module provides an estimate of peak intensities as well as the energy and angular distributions of the emitted electron flux.
glass ball SRD 82 NIST Electron Effective-Attenuation-Length Database (PC database, no charge)  Keywords for Database
This database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at selected electron energies between 50 eV and 2,000 eV. The database was designed mainly to provide EALs (to account for effects of elastic-eletron scattering) for applications in surface analysis by Auger-electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS).
glass ball SRD 71 NIST Electron Inelastic-Mean-Free-Path Database (PC database, no charge)  Keywords for Database
This database provides values of electron inelastic mean free paths (IMFPs) for use in quantitative surface analyses by AES and XPS.
glass ball Standard Test Data and Peak Fitting for XPS Measurements (Web, free access)  Keywords for Database
This web site provides an extensive set of simulated photoelectron spectroscopy data for users to test software for determining the positions and intensities of overlapping peaks. Users download the data, perform their analyses, and then upload their results. A Java program evaluates the results and provides a graphical presentation of the errors in the user's analyses.
glass ball SRD 20 X-ray Photoelectron Spectroscopy Database (Version 4.1) (Web, free access)  Keywords for Database
The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.


Last modified: November 6, 2008 (Created: November 9, 2001)
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