This database has been designed to facilitate quantitative interpretation of Auger-electron and X-ray photoelectron spectra and to improve the accuracy of quantitation in routine analysis. The database contains all physical data needed to perform quantitative interpretation of an electron spectrum for a thin-film specimen of given composition. A simulation module provides an estimate of peak intensities as well as the energy and angular distributions of the emitted electron flux.
The following Journal of Physical and Chemical Reference Data articles may also be of interest: Adobe Acrobat Reader is required to view these articles. (1 articles(s) found)
Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces C. J. Powell, A. Jablonski JPCRD28(1) pp. 19-62 (1999) Abstract
November 6, 2008
November 9, 2001)